Summer School on Metrology for Thin Film Materials

Special Summer School on Metrology for Thin Films Materials, organized within the EMPR project ENG53 ThinErgy.

The Summer School will take place on Monday, 26 September 2016. The duration is all day.


Schedule

Morning Session

8.45 : Omar El Gawhary (VSL): Opening and welcome to all participants.

9.00 : 10.30  Paul Urbach (TU Delft) – Current research on superresolution microscopy

10.30 : 10:45  Coffee break

10:45 : 12.00   Andreas Hertwig (BAM) Analysing thin films by spectroscopic ellipsometry: Accuracy, Traceability, and complex properties

12.00 : 14.00: Lunch. (Lunch is offered to all participants). Possibility for student visit to PVcomB (13:00-13:45)

Afternoon Session

14.00 : 15.30 Peter de Groot (Zygo) Interference microscopy and materials characterization.

15:30 : 16.00 Coffee break

16.00: 17.30 Poul-Erik Hansen, (DFM), Inverse problems and material properties.

Close of the school.